TY  - JOUR
AU  - Jason Campbell
AU  - Kin Cheung
AU  - Liangchun Yu
AU  - John Suehle
AU  - Kuang Sheng
AU  - A Oates
C2  - IEEE Electron Device Letters
DA  - 2011-01-03
LA  - en
M1  - 32
PB  - IEEE Electron Device Letters
PY  - 2011
TI  - Geometric Magnetoresistance Mobility Extraction in Highly Scaled Transistors
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905955
ER  -