TY  - CONF
AU  - Jan Obrzut
AU  - Oleg Kirillov
C2  - 2011 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Grenoble, -1
DA  - 2011-05-26
LA  - en
PB  - 2011 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Grenoble, -1
PY  - 2011
TI  - Microwave Characterization of Transparent Conducting Films
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907453
ER  -