TY  - CONF
AU  - Chukwudi Okoro
AU  - Yaw Obeng
AU  - Jan Obrzut
AU  - Pavel Kabos
AU  - Klaus Hummler
C2  - Proceeding of IEEE Electronic Components and Technology Conference (ECTC), Las Vegas, NV
DA  - 2013-05-28
LA  - en
PB  - Proceeding of IEEE Electronic Components and Technology Conference (ECTC), Las Vegas, NV
PY  - 2013
TI  - Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis
ER  -