TY  - GEN
AU  - Muralikrishnan, Balasubramanian
AU  - Shilling, Katharine
AU  - Phillips, Steven
AU  - Ren, Wei
AU  - Lee, Vincent
AU  - Kim, Felix
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2019-07-11
DO  - https://doi.org/10.6028/jres.124.014
LA  - en
M1  - 124
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2019
TI  - X-ray computed tomography instrument performance evaluation, Part I: Sensitivity to detector geometry errors
ER  -