TY  - JOUR
AU  - Obeng, Yaw
AU  - Cheung, Kin
AU  - Veksler, Dmitry
AU  - Sunday, Christopher
C2  - Journal of Applied Physics
DA  - 2017-11-01
LA  - en
PB  - Journal of Applied Physics
PY  - 2017
TI  - Microwave Evaluation of Electromigration Susceptibility in Advanced Interconnects
ER  -