TY  - JOUR
AU  - Allen, Andrew
AU  - Zhang, Fan
AU  - Kline, Regis
AU  - Guthrie, William
AU  - Ilavsky, Jan
C2  - Journal of Applied Crystallography
DA  - 2017-04-01
DO  - https://doi.org/10.1107/S1600576717001972
LA  - en
M1  - 50
PB  - Journal of Applied Crystallography
PY  - 2017
TI  - NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering
ER  -