TY  - CONF
AU  - Robert Keller
AU  - David Read
AU  - Roey Shaviv
AU  - Greg Harm
AU  - Sangita Kumari
C2  - 2011 IEEE International Reliability Physics Symposium, Monterey, CA
DA  - 2011-04-10
DO  - https://doi.org/10.1109/IRPS.2011.5784570
LA  - en
PB  - 2011 IEEE International Reliability Physics Symposium, Monterey, CA
PY  - 2011
TI  - Electromigration of Cu Interconnects Under AC, Pulsed-DC and DC Test Conditions - Ramifications on Accelerated Testing
ER  -