TY  - JOUR
AU  - Kun Xu
AU  - Oleg Kirillov
AU  - David Gundlach
AU  - Nhan Nguyen
AU  - Pei Ye
AU  - Min Xu
AU  - Lin Dong
AU  - Hong Sio
C2  - Journal of Applied Physics
DA  - 2013-01-09
DO  - https://doi.org/10.1063/1.4774038
LA  - en
M1  - 113
PB  - Journal of Applied Physics
PY  - 2013
TI  - Band Offset Determination of Atomic-Layer-Deposited Al2O3 and HfO2 on InP by Internal Photoemission and Spectroscopic Ellipsometry
ER  -