TY  - VIDEO
AU  - Jacob Garcia
AU  - Ann Chiaramonti Debay
C2  - Electronic Device Failure Analysis magazine
DA  - 2024-02-01 05:02:00
LA  - en
M1  - 26
PB  - Electronic Device Failure Analysis magazine
PY  - 2024
TI  - Advanced Characterization of Materials using Atom Probe Tomography
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936728
ER  -