TY  - CONF
AU  - Ramadurgakar, Ameya
AU  - Rezac, Jake
AU  - Heijnen, Lennart
AU  - Remley, Kate
AU  - Williams, Dylan
AU  - Piket-May, Melinda
AU  - Horansky, Rob
C2  - 2023 IEEE Physical Assurance and Inspection of Electronics (PAINE), Huntsville, AL, US
DA  - 2023-11-20 05:11:00
DO  - https://doi.org/10.1109/PAINE58317.2023.10318021
LA  - en
PB  - 2023 IEEE Physical Assurance and Inspection of Electronics (PAINE), Huntsville, AL, US
PY  - 2023
TI  - Robust Measurements for RF Fingerprinting with Constellation Patterns of Radiated Waveforms
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956276
ER  -