TY  - CONF
AU  - Jon Pratt
AU  - John Kramar
AU  - Gordon Shaw
AU  - Richard Gates
AU  - Paul Rice
AU  - John Moreland
C2  - NSTI Nanotechnology Conference and Trade Show 2006, Boston, MA
DA  - 2006-01-01
LA  - en
PB  - NSTI Nanotechnology Conference and Trade Show 2006, Boston, MA
PY  - 2006
TI  - New Reference Standards and Artifacts for Nanoscale Physical Property Characterization
ER  -