@conference{98291,
  author = {Randolph Elmquist},
  title = {What Metrology Gains With Quantized Resistance Standards},
  year = {2000},
  month = {2000-12-01},
  publisher = {Proc. Metrologia 2000 Conference , Sao Paulo, BR},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29465},
  language = {en},
}