@conference{842531,
  author = {Bin Li and Li Shi and Paul Ho and JiPing Zhou and Richard Allen and Michael Cresswell},
  title = {Test Structures for Study of Electron Transport in Nickel Silicide Features with Linewidths between 40 nm and 100 nm},
  year = {2006},
  month = {2006-04-01 00:04:00},
  publisher = {IEEE ICMTS International Conference on Microelectronic Test Structures, Austin, TX, USA},
  language = {en},
}