@conference{801486,
  author = {Yu Lei and Raghu Kacker},
  title = {Combinatorial Test Generation for Software Product Lines Using Minimum Invalid Tuples},
  year = {2014},
  month = {2014-01-09 00:01:00},
  publisher = {15th IEEE International Symposium on High Assurance Systems Engineering (HASE 2014)
, Miami, FL, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914788},
  doi = {https://doi.org/10.1109/HASE.2014.18},
  language = {en},
}