@conference{795546,
  author = {Jose Ortiz-Rodriguez and Allen Hefner Jr. and David Berning and Colleen Hood and S. Olcum},
  title = {Computer-Controlled Characterization of High-Voltage, High-Frequency SiC Devices},
  year = {2006},
  month = {2006-07-01 00:07:00},
  publisher = {Proceedings of the IEEE COMPEL Workshop 2006, Troy, NY, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32380},
  language = {en},
}