@conference{758876,
  author = {Tam Duong and David Berning and Allen Hefner Jr. and Keyue Smedley},
  title = {Long-Term Stability Test System for High-Voltage, High-Frequency SiC Power Devices},
  year = {2007},
  month = {2007-02-25 00:02:00},
  publisher = {The Applied Power Electronics Conference and Exposition, Anaheim, CA, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32547},
  language = {en},
}