@conference{67341,
  author = {Chen Wang and Liangchun Yu and Jason Campbell and Kin Cheung and Yi Xuan and Peide Ye and John Suehle and David Zhang},
  title = {An Improved Fast I<sub> d </sub>-V ^d g Measurement Technology With Expanded Application Range},
  year = {2009},
  month = {2009-10-19},
  publisher = {2009 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP
, Reno, NV},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904155},
  language = {en},
}