@article{64206, author = {Cedric Powell and Aleksander Jablonski}, title = {Influence of Elastic-Electron Scattering on Measurements of Sillicon Dioxide Film Thicknesses by X-Ray Photoelectron Spectroscopy}, year = {2001}, number = {19}, month = {2001-09-01}, publisher = {Journal of Vacuum Science and Technology A}, language = {en}, }