@article{48341,
  author = {Jason Campbell and Kin Cheung and John Suehle and A Oates},
  title = {The Role of High-Field Stress in the Negative Bias Temperature Instability},
  year = {2010},
  number = {10},
  month = {2010-12-01},
  publisher = {IEEE Transactions on Device and Materials Reliability},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902186},
  language = {en},
}