@conference{26051,
  author = {Chukwudi Okoro and Yaw Obeng and Jan Obrzut and Pavel Kabos and Klaus Hummler},
  title = {Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis},
  year = {2013},
  month = {2013-05-28},
  publisher = {Proceeding of IEEE Electronic Components and Technology Conference (ECTC), Las Vegas, NV},
  language = {en},
}