@article{215931,
  author = {Mark Vaudin and William Osborn and Lawrence Friedman and Justin Gorham and Robert Cook and Victor Vartanian},
  title = {Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on Si},
  year = {2015},
  number = {148},
  month = {2015-01-01},
  publisher = {Ultramicroscopy},
  doi = {https://doi.org/10.1016/j.ultramic.2014.09.007},
  language = {en},
}