@article{21286,
  author = {Kun Xu and Oleg Kirillov and David Gundlach and Nhan Nguyen and Pei Ye and Min Xu and Lin Dong and Hong Sio},
  title = {Band Offset Determination of Atomic-Layer-Deposited Al2O3 and HfO2 on InP by Internal Photoemission and Spectroscopic Ellipsometry},
  year = {2013},
  number = {113},
  month = {2013-01-09},
  publisher = {Journal of Applied Physics},
  doi = {https://doi.org/10.1063/1.4774038},
  language = {en},
}