@conference{135371,
  author = {Dylan Williams and Uwe Arz and Hartmut Grabinski},
  title = {Accurate Characteristic Impedance Measurement on Silicon},
  year = {1998},
  number = {3},
  month = {1998-06-01},
  publisher = {Tech. Dig.,   IEEE MTT-S International Microwave Symposium, Baltimore, MD},
  doi = {https://doi.org/10.1109/MWSYM.1998.700955},
  language = {en},
}