Bookmark and Share MSEL Topics

Biomaterials


3D Tissue Scaffolds

Dental Materials

Bio Imaging

Instrumented Bioreactors

Protein Preservation

Medical Device Reliability

Cell/Scaffold Constructs for Nanoparticle Screening

Ceramics


Ceramic Phase Equilibrium Data

Crystallographic Databases

Diffraction Metrology & Standards

Measurement & Prediction of Local Structure in Electronic Ceramics

MEMS and NEMS Mechanical Reliability Measurements

Nanocalorimetry Measurements

Nanometer Scale Measurements of Crack Tips in Glass

Thermoelectric Measurements and Standards

Hybrid Materials


Future Directions for Magnetic Sensors

Fuel Cell Membranes

Macromolecule and Nanoparticle Composition and Architecture

Metals


Charpy Impact Verification

Hydrogen Pipeline Safety

Magnetic Imaging

Mechanical Performance- Extreme Conditions

NIST Center for Metal Forming

Fundamentals of Deformation

Hydrogen Storage

Metrics for Reactive Wetting in Complex Systems

Pipeline Safety

Hardness Standardization

Materials Codes & Standards for H² Distribution

Thermodynamics & Kinetic Data for Sustainable Energy

Nanomaterials


AFM Based Nanomechanics

Nanotube Metrology

Directed Assembly of Functional Nanoscale Materials Fate of Nanoparticles in Biosystems

Magnetic Nanoparticle Metrology

Magnetic Nanostructures for post-CMOS Electronics

Microscopy Methods

Nanoindentation Measurements and Standards

Nanoparticle Metrology and Standards for Biomedical Applications and Health

Scanned Probe Microscopy Measurements and Standards

Semiconductor Nanowire Metrology

Synchrotron Beamline Operations

Synchrotron X-ray Measurements

Polymers


Balistic Body Armor

Combinatorial Approaches to Thin Film Nanomaterials

Mechanics of Complex Interfaces

Micro-rheometry

Nanoimprint Lithography

Nanoscale Thermal Properties

NIST Combinatorial Methods Center

Organic Electronics

Polymer Formulations

Templated Self-Assembly

Semiconductors


Combinatorial Measurement Methods for Advanced CMOS Devices

Electrochemistry of Metal-Semiconductor Interfaces

Fatigue in Silicon

Dimensional Metrology of Nanoscale Patterns

Piezospectroscopy Measurements and Standards

Polymers for Next-Generation Lithography

Thin Film Reliability

Thin Film X-ray Reflectometry

Piezospectroscopy

Piezospectroscopy Measurements and Standards Project

Contact

Materials Science & Engineering Laboratory (MSEL)
Dr. Richard Cavanagh, Acting Director

(301) 975-5658 Telephone
(301) 975-5012 Facsimile

NIST, 100 Bureau Drive M/S 8500
Gaithersburg, MD 20899-8500
msel@nist.gov